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2H-TaSe2 (2H phase Tantalum Diselenide)
2H-TaSe2 is a metal, an incommensurate Charge density waves (CDW) system at ~120K, a commensurate CDW at ~90K and a superconductor with Tc ~0.1K. The layers are stacked together via van der Waals interactions and can be exfoliated into thin 2D layers. Tantalum Diselenide belongs to the group-V transition metal dichalcogenides (TMDC).
The 2H phase TaSe2 crystals produced at HQ Graphene have a typical lateral size of ~0.6-0.8 cm, hexagonal shaped and have a metallic appearance.
2H TaSe2 crystal properties
| Crystal size | ~10 mm |
| Electrical properties | Metal, Charge density waves (CDW) system at ~120K, Superconductor (Tc ~0.1K) |
| Crystal structure | hexagonal |
| Unit cell parameters | a = b = 0.342 nm, c = 1.255 nm, α = β = 90° , γ = 120° |
| Type | Synthetic |
| Purity | >99.995 % |
| Characterized by | XRD, Raman, EDX |
The single crystal 2H TaSe2 is characterized using:
XRD: single crystal and powder X-ray diffraction (D8 Venture Bruker and D8 Advance Bruker)
EDX: Energy-dispersive X-ray spectroscopy for stoichiometric analysis
Raman: 785 nm Raman system
Raman, XRD and EDX on 2H TaSe2:
X-ray diffraction on a 2H-TaSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 6, 8, 10
Powder X-ray diffraction (XRD) of a single crystal 2H-TaSe2. X-ray diffraction was performed at room temperature using a D8 Venture
Bruker.Stoichiometric analysis of a single crystal 2H-TaSe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal 2H-TaSe2. Measurement was performed with a 785 nm Raman system at room temperature.
